Elipsometry

Spectroscopic ellipsometry is an optical measurement method used for the characterization of thin films. This method is based on the change in the polarization of light during reflection from the sample. Based on the measured data, we can subsequently determine certain parameters of the measured samples (mostly thin films)—for example, the complex refractive index, layer thickness, and absorption coefficient.

When using a liquid cell, it is also possible to study changes in thin films (swelling, dissolution) and the adhesion of biomolecules in an aqueous environment. The M-2000DI optical ellipsometer (J. A. Woollam Co., Inc.) used by us operates in the spectral range of 192-1690 nm, and focusing attachments can be utilized to improve spatial resolution.